Focused Ion Beam Scanning Electron Microscope
Value
Estimated€610,000 · 610,000 EUR
Awarded€610,000 · 610,000 EUR
WinnerCarl Zeiss B.V. · KvK 32033579
Who already wins at this buyer
Firms with recorded awards from Technische Universiteit Delft in this tender’s CPV categories — the incumbents you are bidding against.
| Firm | Wins | Awarded | Last win |
|---|---|---|---|
| RTDS Technologies Inc | 3 | €39,922,800 | 2026-07-10 |
| LaVision GmbH | 2 | €575,820 | 2026-07-20 |
| FEI Europe B.V. · KvK 17097158 | 1 | €775,000 | 2026-05-22 |
| Aixtron SE | 1 | — | 2026-06-22 |
| Bluefors Oy | 1 | — | 2026-07-17 |
Full buyer profile: what Technische Universiteit Delft buys and who wins it →
CPV codes
38511000 Laboratory, optical & precision equipmentDescription
Voor deze onderzoeksdoelen is gedetailleerde analyse van microstructuren en interfaces essentieel. Een FIB-SEM (Focused Ion Beam Scanning Electron Microscope) is noodzakelijk om: • 3D-reconstructies van elektrodematerialen te maken en porositeit en degradatiemechanismen te analyseren. • Lokale karakterisering van interfaces, zoals de Solid Electrolyte Interphase, uit te voeren, wat cruciaal is voor levensduur en veiligheid. • Structurele veranderingen tijdens batterijcycli te onderzoeken, ter ondersteuning van de ontwikkeling van nieuwe batterijchemieën. • Monsters met hoge precisie voor te bereiden voor Transmission Electron Microscopy (TEM) en operando studies. 1
Similar tenders
Closest by meaning — across languages, via embeddings.
| Published | Title | Buyer | Match |
|---|---|---|---|
| 2026-07-02 | Focused Ion Beam, Scanning Electron Microscope (FIB-SEM) | Lunds universitet SE | 94% |
| 2026-07-16 | Plasma FIB/SEM for room-temperature and cryogenic applications | — CH | 90% |
| 2026-07-16 | Cryo-Focused Ion Beam - Scanning Electron Microscope | VIB vzw BE | 90% |
| 2026-06-18 | Maintenance and repair of electron microprobe and microscopes for the examination of highly radioactive samples | European Commission, DG JRC - Joint Research Centre DE | 90% |
| 2026-06-04 | WAFER-CAPABLE PLASMA FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPE (PFIB-SEM) SYSTEM | — BE | 89% |
| 2026-05-22 | 11835 - Field-Emission Scanning Electron Microscope (FE-SEM) | Technische Universiteit Delft NL | 89% |