Maintenance and repair of electron microprobe and microscopes for the examination of highly radioactive samples
TED · 417369-2026can-standardawardedNo deadline given
Buyer
NameEuropean Commission, DG JRC - Joint Research Centre
CountryDE
Published2026-06-18
Deadline—
CPV codes
50000000 Repair & maintenance servicesDescription
JRC Karlsruhe intends to make a call for tender for the maintenance of their equipment used for microstructure investigation. It consists in a set of devices including a shielded electron probe microanalyser (EPMA) a nuclearized Transmission Electron Microscope (TEM), two nuclearized Scanning Electron Microscopes (SEM), a Focused Ion Beam (FIB) as well as two standards SEM. The service will include preventive maintenance of the equipment and repairs as well as provision of spare parts.
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| 2026-05-22 | 11835 - Field-Emission Scanning Electron Microscope (FE-SEM) | Technische Universiteit Delft NL | 89% |
| 2026-06-12 | Scanning Electron Microscope (SEM) | Högskolan i Borås SE | 88% |
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Records136,978 tendersNewest notice2026-06-24Last ingest2026-06-25 · TED daily 06:00Parser health (7d)all runs clean