Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)
TED · 456632-2026Contract noticeCloses in 8 days · 2026-08-24
Value
Estimated€2,523,546 · 28,000,000 SEK
Awarded—
Who already wins at this buyer
Firms with recorded awards from Lunds universitet in this tender’s CPV categories — the incumbents you are bidding against.
| Firm | Wins | Awarded | Last win |
|---|---|---|---|
| AIXTRON Ltd. | 3 | €8,534,459 | 2026-06-29 |
| Scienta Omicron | 2 | €180,253 | 2026-07-06 |
| Oxford Nanopore Technologies | 1 | €498,708 | 2026-07-16 |
| Xvivo Perfusion AB | 1 | €372,069 | 2026-05-07 |
| CHROMATOTEC | Norsk Analyse AB | 1 | €363,526 | 2026-04-30 |
Full buyer profile: what Lunds universitet buys and who wins it →
CPV codes
38511100 Laboratory, optical & precision equipment38000000 Laboratory, optical & precision equipmentDescription
Lund Nano Lab (LNL) at Lund University intends to purchase a Focused Ion Beam Scanning Electron Microscope, in this document referred to as the FIB-SEM, instrument or equipment. This document lists all the requirements the FIB-SEM must meet. The instrument is intended to be used for high-resolution imaging, materials analysis and preparing samples for TEM analysis as well as for experiments at the MAX IV synchrotron.
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| 2026-05-29 | Focused Ion Beam Scanning Electron Microscope | Technische Universiteit Delft NL | 94% |
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| 2026-06-04 | WAFER-CAPABLE PLASMA FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPE (PFIB-SEM) SYSTEM | — BE | 91% |
| 2026-04-30 | Supply, Delivery and Installation of a Transmission Electron Microscopy (TEM) Suite consisting of 2 TEM tools and 1 Focused Ion Beam–Scanning Electron Microscope (FIB.SEM) for Tyndall Instit, UCC, | University College Cork IE | 90% |