Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)
TED · 456632-2026cn-standardCloses in 53 days · 2026-08-24
Buyer
NameLunds universitet
CountrySE
Published2026-07-02
Deadline2026-08-24
Value
Estimated€2,523,546 · 28,000,000 SEK
Awarded—
CPV codes
38511100 Laboratory, optical & precision equipment38000000 Laboratory, optical & precision equipmentDescription
Lund Nano Lab (LNL) at Lund University intends to purchase a Focused Ion Beam Scanning Electron Microscope, in this document referred to as the FIB-SEM, instrument or equipment. This document lists all the requirements the FIB-SEM must meet. The instrument is intended to be used for high-resolution imaging, materials analysis and preparing samples for TEM analysis as well as for experiments at the MAX IV synchrotron.
Records162,040 tendersNewest notice2026-07-03Last ingest2026-07-03 · TED daily 06:00Parser health (7d)all runs clean