WAFER-CAPABLE PLASMA FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPE (PFIB-SEM) SYSTEM
TED · 382478-2026Contract noticeNo deadline given
Buyer
Name—
CountryBE
Published2026-06-04
Deadline—
Value
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CPV codes
38000000 Laboratory, optical & precision equipmentDescription
WAFER-CAPABLE PLASMA FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPE (PFIB-SEM) SYSTEM
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