Metrology SEM+FIB system
Buyer
NameNederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
CountryNL
Published2026-07-28
Deadline2026-09-07
Value
Estimated€1,300,000 · 1,300,000 EUR
Awarded—
Who already wins at this buyer
Firms with recorded awards from Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO in this tender’s CPV categories — the incumbents you are bidding against.
| Firm | Wins | Awarded | Last win |
|---|---|---|---|
| AP&S International GmbH | 2 | €5,008,475 | 2026-10-21 |
| Bruker France SAS | 2 | €906,802 | 2026-10-19 |
| Raith GmbH | 1 | €1,328,060 | 2026-05-07 |
| RENA Technologies GmbH | 1 | €1,298,488 | 2026-07-07 |
| KLA | 1 | €531,960 | 2026-06-25 |
CPV codes
31712000 Electrical machinery & lighting38900000 Laboratory, optical & precision equipmentBid-check (AI extraction — facts with quotes, not advice)
Description
The main purpose of this FIB/SEM equipment is to perform material milling (cutting), 3D characterization, and cross section analysis of epitaxially grown InP, InGaAs, InAlGaAs and InGaAsP layers on InP substrates. The structures may also contain polymer-based planarization layers, SiOx or SiNx dielectric layers and TiPtAu or NiGeAu metal layers. Levering van één SEM +FIB systeem
Similar tenders
Closest by meaning — across languages, via embeddings.
| Published | Title | Buyer | Match |
|---|---|---|---|
| 2026-05-21 | Metrology SEM+FIB system | Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO NL | 91% |
| 2026-07-02 | Focused Ion Beam, Scanning Electron Microscope (FIB-SEM) | Lunds universitet SE | 88% |
| 2026-10-15 | The procurement of the Supply, Installation and Commissioning of a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) with Gallium Ion Source | Danmarks Tekniske Universitet - DTU DK | 88% |
| 2026-05-29 | Focused Ion Beam Scanning Electron Microscope | Technische Universiteit Delft NL | 87% |
| 2026-07-16 | Plasma FIB/SEM for room-temperature and cryogenic applications | — CH | 87% |
| 2026-05-13 | Semi-automated probe system with accessories | IHP GmbH - Leibniz-Institut für innovative Mikroelektronik DE | 87% |