double corrected Transmission Electron microscope (TEM)
TED · 316800-2026Contract noticeNo deadline given
Buyer
Name—
CountryBE
Published2026-05-08
Deadline—
Value
Estimated—
Awarded—
CPV codes
38000000 Laboratory, optical & precision equipmentDescription
DOUBLE CORRECTED TRANSMISSION ELECTRON MICROSCOPE (TEM)
Similar tenders
Closest by meaning — across languages, via embeddings.
| Published | Title | Buyer | Match |
|---|---|---|---|
| 2026-07-07 | Voluntary Transparancy Transmission Electron Microscope | Leids Universitair Medisch Centrum (LUMC) NL | 89% |
| 2026-07-24 | High-resolution Scanning electron microscope (SEM) | Tampere University Foundation sr FI | 89% |
| 2026-06-04 | WAFER-CAPABLE PLASMA FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPE (PFIB-SEM) SYSTEM | — BE | 87% |
| 2026-07-16 | Cryo-Focused Ion Beam - Scanning Electron Microscope | VIB vzw BE | 87% |
| 2026-06-18 | Maintenance and repair of electron microprobe and microscopes for the examination of highly radioactive samples | European Commission, DG JRC - Joint Research Centre DE | 87% |
| 2026-07-24 | Acquisition d’un microscope électronique en transmission haute résolution 120kV équipé de modules STEM et EDS | Université Clermont Auvergne FR | 86% |