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200 mm Semi-Automatic RF Probe System for On-Wafer Measurements up to 250 GHz

TED · 432100-2026cn-standardCloses in 29 days · 2026-07-24

Buyer

NameIHP GmbH - Leibniz-Institut für innovative Mikroelektronik

CountryDE

Published2026-06-25

Deadline2026-07-24

Value

Estimated—

Awarded—

CPV codes

38341300 Laboratory, optical & precision equipment38540000 Laboratory, optical & precision equipment

Description

200 mm Semi-Automatic RF Probe System for On-Wafer Measurements up to 250 GHz

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Source

View the official notice on TED ↗