300 mm Semi-Automatic RF Probe System for On-Wafer Measurements up to 250 GHz

TED · 413311-2026cn-standardCloses in 21 days · 2026-07-16

Buyer

NameIHP GmbH - Leibniz-Institut für innovative Mikroelektronik

CountryDE

Published2026-06-16

Deadline2026-07-16

Estimated—

Awarded—

38341300 Laboratory, optical & precision equipment38540000 Laboratory, optical & precision equipment

300 mm Semi-Automatic RF Probe System for On-Wafer Measurements up to 250 GHz

Closest by meaning — across languages, via embeddings.

Published	Title	Buyer	Match
2026-06-12	Prior Information Notice – RF On-Wafer Probe Station	Ferdinand-Braun-Institut gGmbH Leibniz-Institut für Höchstfrequenztechnik DE	91%
2026-06-12	Prior Information Notice – RF Measurement System for On-Wafer Characterisation	Ferdinand-Braun-Institut gGmbH Leibniz-Institut für Höchstfrequenztechnik DE	90%
2026-05-13	Semi-automated probe system with accessories	IHP GmbH - Leibniz-Institut für innovative Mikroelektronik DE	89%
2026-05-20	CMP-System 100/150‑mm‑Wafer (IAF-03) - PR1199438-2050-P	— DE	88%
2026-05-19	Automated wafer prober (IMS-04) - PR1119714-2380-P	Fraunhofer-Gesellschaft - Einkauf B12 DE	88%
2026-06-05	Silicon Austria Labs – Magnetic Wafer Prober	Silicon Austria Labs GmbH AT	88%